Optical properties measurements:

• Numerous spectrophotometers, optical spectrum analyzers, or tunable sources, providing transmittance (and reflectance) measurement capabilities from the UV to far-infrared range (200 nm to 50 µm wavelength range).
• Accessories to isolate polarization, set the angle of incidence or even adjust the filter temperature (from ~15K to 500K). 

Wavefront measurements:

We have multiple standard and specialized interferometers including:

• Standard Fizeau interferometers at 633 nm for measuring surface flatness, transmitted and reflected wavefronts, and various characteristics of flat polished optical surfaces up to 200 mm in diameter
• NIR (600-1200 nm) and SWIR (900-1700 nm) wavelength specific wavefront sensors able to measure optics up to 150mm in diameter, or down to 5mm in diameter in high volume manufacturing. 
• These have been instrumental at developing our models for predicting the effects of multilayer designs and manufacturing errors on the transmitted and reflected wavefront errors for all our filters, at any wavelength “in band” or “out of band”, something not every filter manufacturer can predict and verify.
• Short-coherence length interferometers allows for single-surface measurements on highly parallel optics.
• White-light micro-interferometers provide detailed information of the characteristics of polished surface roughness and texture.

Surface defect inspection:

We use custom-designed equipment for the inspection of surfaces:

• Bright-field, dark-field, and differential contrast microscopes.
• Surface quality is quantitatively measured and recorded, and complete reports with defect maps can be provided with selected filters.